TY - GEN
T1 - An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone
AU - Li, Tianqi
AU - Maeshima, Junji
AU - Shumiya, Hideki
AU - Pommerenke, David J.
AU - Yamada, Takashi
AU - Araki, Kenji
PY - 2012/12/12
Y1 - 2012/12/12
N2 - An LED circuit of a cell phone is analyzed using the System-Efficient-ESD- Design (SEED) methodology [1]. The method allows simulation of the ESD current path, and the interaction mechanisms between the clamp and the on-chip ESD protection circuit. The I-V curve and the non-linear behavior under high current pulses of every component including R, L, C, and ferrite beads are measured and modeled. By combining all of the component models, a complete circuit model is built for predicting the circuit behavior and damaging threshold at a given setting-voltage of a Transmission Line Pulser (TLP).
AB - An LED circuit of a cell phone is analyzed using the System-Efficient-ESD- Design (SEED) methodology [1]. The method allows simulation of the ESD current path, and the interaction mechanisms between the clamp and the on-chip ESD protection circuit. The I-V curve and the non-linear behavior under high current pulses of every component including R, L, C, and ferrite beads are measured and modeled. By combining all of the component models, a complete circuit model is built for predicting the circuit behavior and damaging threshold at a given setting-voltage of a Transmission Line Pulser (TLP).
UR - http://www.scopus.com/inward/record.url?scp=84870672825&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2012.6351824
DO - 10.1109/ISEMC.2012.6351824
M3 - Conference paper
AN - SCOPUS:84870672825
SN - 9781467320610
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 346
EP - 350
BT - EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 5 August 2012 through 10 August 2012
ER -