Alternative Patterning Strategies for Reduced Thermal Stress during Focused Ion Beam Processing

Harald Plank, Roland Schmied, Evelin Fisslthaler, Boril Chernev, Claudia Mayrhofer

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

Originalsprache	deutsch
Publikationsstatus	Veröffentlicht - 5 Sept. 2011
Veranstaltung	10th Multinational Congress on Microscopy: MCM 2011 - Urbino, Italien Dauer: 4 Sept. 2011 → 9 Sept. 2011

Konferenz	10th Multinational Congress on Microscopy
Kurztitel	MCM2011
Land/Gebiet	Italien
Ort	Urbino
Zeitraum	4/09/11 → 9/09/11

Fields of Expertise

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title = "Alternative Patterning Strategies for Reduced Thermal Stress during Focused Ion Beam Processing",

author = "Harald Plank and Roland Schmied and Evelin Fisslthaler and Boril Chernev and Claudia Mayrhofer",

year = "2011",

month = sep,

day = "5",

language = "deutsch",

note = "10th Multinational Congress on Microscopy : MCM 2011, MCM2011 ; Conference date: 04-09-2011 Through 09-09-2011",

}

TY - CONF

T1 - Alternative Patterning Strategies for Reduced Thermal Stress during Focused Ion Beam Processing

AU - Plank, Harald

AU - Schmied, Roland

AU - Fisslthaler, Evelin

AU - Chernev, Boril

AU - Mayrhofer, Claudia

PY - 2011/9/5

Y1 - 2011/9/5

M3 - (Altdaten) Vortrag oder Präsentation

T2 - 10th Multinational Congress on Microscopy

Y2 - 4 September 2011 through 9 September 2011

ER -