AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Alexander Fian, Anja Haase, Barbara Stadelober, Georg Jakopic, Nadezda Matsko, Werner Grogger, Günther Leising

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)1455-1461
FachzeitschriftAnalytical and Bioanalytical Chemistry
Jahrgang390
Ausgabenummer6
DOIs
PublikationsstatusVeröffentlicht - 2008

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors. / Fian, Alexander; Haase, Anja; Stadelober, Barbara; Jakopic, Georg; Matsko, Nadezda; Grogger, Werner; Leising, Günther.

in: Analytical and Bioanalytical Chemistry, Jahrgang 390, Nr. 6, 2008, S. 1455-1461.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Fian, Alexander ; Haase, Anja ; Stadelober, Barbara ; Jakopic, Georg ; Matsko, Nadezda ; Grogger, Werner ; Leising, Günther. / AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors. in: Analytical and Bioanalytical Chemistry. 2008 ; Jahrgang 390, Nr. 6. S. 1455-1461.
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AU - Fian, Alexander

AU - Haase, Anja

AU - Stadelober, Barbara

AU - Jakopic, Georg

AU - Matsko, Nadezda

AU - Grogger, Werner

AU - Leising, Günther

PY - 2008

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SN - 1618-2642

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