Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diﬀusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diﬀusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the eﬀects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.
Fields of Expertise
- Advanced Materials Science