Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

Tom Furnival, Daniel Knez, Eric Schmidt, Rowan K. Leary, Gerald Kothleitner, Ferdinand Hofer, Paul D. Bristowe, Paul Midgley

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Abstract

Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diffusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diffusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the effects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.
Originalspracheenglisch
Seiten (von - bis)183104
FachzeitschriftApplied Physics Letters
Jahrgang113
Ausgabenummer18
DOIs
PublikationsstatusVeröffentlicht - 2018

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adatoms
electron microscopy
aberration
catalysis
electron beams
transmission electron microscopy
fabrication
scanning electron microscopy
adsorption
probes

Schlagwörter

    Fields of Expertise

    • Advanced Materials Science

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    Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy. / Furnival, Tom; Knez, Daniel; Schmidt, Eric; Leary, Rowan K.; Kothleitner, Gerald; Hofer, Ferdinand; Bristowe, Paul D.; Midgley, Paul.

    in: Applied Physics Letters, Jahrgang 113, Nr. 18, 2018, S. 183104.

    Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

    Furnival, Tom ; Knez, Daniel ; Schmidt, Eric ; Leary, Rowan K. ; Kothleitner, Gerald ; Hofer, Ferdinand ; Bristowe, Paul D. ; Midgley, Paul. / Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy. in: Applied Physics Letters. 2018 ; Jahrgang 113, Nr. 18. S. 183104.
    @article{02644010e8334784a522a04841cd30e2,
    title = "Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy",
    abstract = "Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diffusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diffusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the effects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.",
    keywords = "Atom surface interaction, transmission electron microscopy (TEM), Machine Learning, surface modification and engineering",
    author = "Tom Furnival and Daniel Knez and Eric Schmidt and Leary, {Rowan K.} and Gerald Kothleitner and Ferdinand Hofer and Bristowe, {Paul D.} and Paul Midgley",
    year = "2018",
    doi = "10.1063/1.5052729",
    language = "English",
    volume = "113",
    pages = "183104",
    journal = "Applied Physics Letters",
    issn = "0003-6951",
    publisher = "American Institute of Physics Publising LLC",
    number = "18",

    }

    TY - JOUR

    T1 - Adatom dynamics and the surface reconstruction of Si(110) revealed using time-resolved electron microscopy

    AU - Furnival, Tom

    AU - Knez, Daniel

    AU - Schmidt, Eric

    AU - Leary, Rowan K.

    AU - Kothleitner, Gerald

    AU - Hofer, Ferdinand

    AU - Bristowe, Paul D.

    AU - Midgley, Paul

    PY - 2018

    Y1 - 2018

    N2 - Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diffusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diffusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the effects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.

    AB - Surface dynamics lie at the heart of many areas of materials and chemical science, including heterogeneous catalysis, epitaxial growth and device fabrication. Characterizing the dynamics of surface adsorption, reactions and diffusion at the atomic scale is crucial to understanding and controlling such processes. Here we use aberration-corrected scanning transmission electron microscopy to analyze the diffusive behavior of Pt atoms adsorbed on the Si(110) surface, and characterize the effects of the electron beam on adatom motion, including a bias introduced by the raster scan of the probe. We further observe the evolution of the Si(110) surface, revealing evidence of developing surface steps attributed to the 16×2 surface reconstruction. These results demonstrate a framework for studying complex atomic-scale surface dynamics using aberration-corrected electron microscopy.

    KW - Atom surface interaction

    KW - transmission electron microscopy (TEM)

    KW - Machine Learning

    KW - surface modification and engineering

    U2 - 10.1063/1.5052729

    DO - 10.1063/1.5052729

    M3 - Article

    VL - 113

    SP - 183104

    JO - Applied Physics Letters

    JF - Applied Physics Letters

    SN - 0003-6951

    IS - 18

    ER -