A Transient Event Sensor for Efficient System-Level ESD Testing

Abhishek Patnaik*, Shubhankar Marathe, Shun Liu, David Pommerenke, Daryl G. Beetner

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

Testing and debugging of immunity issues is challenging in part because it is not known which components inside a system are impacted by an immunity test or at what level. Attaching cables and probes to determine stress voltages and currents within a system is time consuming and can alter the test results. Sensors are proposed for measuring the peak stress voltage experienced within a system during a transient immunity test. The peak current can also be found when the sensor is placed across a transient voltage suppressor with a known I-V curve. The peak level is transmitted wirelessly to a receiver outside the system using frequency-modulated magnetic or electric fields, thus allowing multiple measurements to be made without opening the enclosure or otherwise modifying the system. Two sensing circuits are proposed: one that stores the peak voltage on an external capacitor and the other that uses an analog-to-digital converter to store the level in a register. The capabilities of the circuits were validated with a combination of SPICE and electromagnetic simulations when the sensor was placed inside a typical cell phone enclosure. Simulations demonstrate that the sensors can accurately detect the peak transient voltage and transmit the level to an external receiver.

Originalspracheenglisch
Seiten (von - bis)1231-1239
Seitenumfang9
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang60
Ausgabenummer5
DOIs
PublikationsstatusVeröffentlicht - 1 Okt 2018
Extern publiziertJa

ASJC Scopus subject areas

  • Atom- und Molekularphysik sowie Optik
  • Physik der kondensierten Materie
  • Elektrotechnik und Elektronik

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