A study on correlation between near-field EMI scan and ESD susceptibility of ICs

Ahmad Hosseinbeig, Omid Hoseini Izadi, Satyajeet Shinde, David Pommerenke, Hideki Shumiya, Junji Maeshima, Kenji Araki

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Correlation between near-field EMI scan and ESD susceptibility scan of a cellphone CPU IC is investigated. It is shown that the ESD susceptibility of the CPU IC depends on the activity of the IC. Based on the obtained correlation between these two scans, it is sufficient to perform the ESD susceptibility scan only by running the application which highly loads the CPU. This reduces the ESD susceptibility measurement time as well as the probability of physical damage to the IC.

Originalspracheenglisch
Titel2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten169-174
Seitenumfang6
ISBN (elektronisch)9781538622308
DOIs
PublikationsstatusVeröffentlicht - 20 Okt 2017
Extern publiziertJa
Veranstaltung2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, USA / Vereinigte Staaten
Dauer: 7 Aug 201711 Aug 2017

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

Konferenz2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
LandUSA / Vereinigte Staaten
OrtWashington
Zeitraum7/08/1711/08/17

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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