A review of statistical modelling and inference for electrical capacitance tomography

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	1-22
Fachzeitschrift	Measurement Science and Technology
Ausgabenummer	20;5
DOIs	https://doi.org/10.1088/0957-0233/20/5/052002
Publikationsstatus	Veröffentlicht - 2009

Treatment code (Nähere Zuordnung)

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title = "A review of statistical modelling and inference for electrical capacitance tomography",

author = "Daniel Watzenig and Colin Fox",

year = "2009",

doi = "10.1088/0957-0233/20/5/052002",

language = "English",

pages = "1--22",

journal = "Measurement Science and Technology",

issn = "1361-6501",

publisher = "IOP Publishing Ltd.",

number = "20;5",

}

TY - JOUR

T1 - A review of statistical modelling and inference for electrical capacitance tomography

AU - Watzenig, Daniel

AU - Fox, Colin

PY - 2009

Y1 - 2009

UR - http://www.iop.org

U2 - 10.1088/0957-0233/20/5/052002

DO - 10.1088/0957-0233/20/5/052002

M3 - Article

SN - 1361-6501

SP - 1

EP - 22

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 20;5

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