A rapid-acquisition electrical time-domain reflectometer for dynamic structure analysis

Joseph A. Bishop, David J. Pommerenke, Genda Chen

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

A rapid-acquisition electrical time-domain reflectometer (TDR) that is capable of acquiring thousands of signatures per second was developed for dynamic structure analysis. The operation of the TDR and its application in the monitoring of dynamic structures are discussed. The TDR was evaluated with a coaxial-cable crack sensor embedded in a full-scale reinforced concrete (RC) column during a 60-s earthquake simulation at the Hyogo Earthquake Engineering Research Center in Japan. The TDR signatures acquired from the sensor during the simulation are analyzed and correlated with the cracks that formed in the RC column.

Originalspracheenglisch
Aufsatznummer5535169
Seiten (von - bis)655-661
Seitenumfang7
FachzeitschriftIEEE Transactions on Instrumentation and Measurement
Jahrgang60
Ausgabenummer2
DOIs
PublikationsstatusVeröffentlicht - 1 Feb 2011
Extern publiziertJa

ASJC Scopus subject areas

  • !!Instrumentation
  • !!Electrical and Electronic Engineering

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