A New Current Probe for Measuring Transient Events Under Data Traffic

Omid Hoseini Izadi; David Johannes Pommerenke; DongHyun Kim

A New Current Probe for Measuring Transient Events Under Data Traffic

Omid Hoseini Izadi, David Johannes Pommerenke, DongHyun Kim

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

Originalsprache	englisch
Titel	Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020
Seitenumfang	8
ISBN (elektronisch)	978-1-7281-9461-5
Publikationsstatus	Veröffentlicht - 13 Sep. 2020
Veranstaltung	42nd Annual EOS/ESD Symposium - Hybrider Event, USA / Vereinigte Staaten Dauer: 13 Sep. 2020 → 17 Sep. 2020

Konferenz

Konferenz	42nd Annual EOS/ESD Symposium
Kurztitel	EOS/ESD 2020
Land/Gebiet	USA / Vereinigte Staaten
Ort	Hybrider Event
Zeitraum	13/09/20 → 17/09/20

ASJC Scopus subject areas

Elektrotechnik und Elektronik

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https://ieeexplore.ieee.org/document/9241219

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@inproceedings{3ecdef6d03a643e7b3a48407569fac0d,

title = "A New Current Probe for Measuring Transient Events Under Data Traffic",

abstract = "Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.",

author = "Izadi, {Omid Hoseini} and Pommerenke, {David Johannes} and DongHyun Kim",

year = "2020",

month = sep,

day = "13",

language = "English",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020",

note = "42nd Annual EOS/ESD Symposium , EOS/ESD 2020 ; Conference date: 13-09-2020 Through 17-09-2020",

}

TY - GEN

T1 - A New Current Probe for Measuring Transient Events Under Data Traffic

AU - Izadi, Omid Hoseini

AU - Pommerenke, David Johannes

AU - Kim, DongHyun

PY - 2020/9/13

Y1 - 2020/9/13

N2 - Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

AB - Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

M3 - Conference paper

BT - Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020

T2 - 42nd Annual EOS/ESD Symposium

Y2 - 13 September 2020 through 17 September 2020

ER -

A New Current Probe for Measuring Transient Events Under Data Traffic

Abstract

Konferenz

ASJC Scopus subject areas

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