Abstract
EMC engineers often use current probes to detect common mode currents. It is necessary to characterize the probes up to Giga Hertz frequencies. Existing calibration methods for current clamps suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This paper also discusses some of the non ideal effects of current clamps.
Originalsprache | englisch |
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Seiten (von - bis) | 163-168 |
Seitenumfang | 6 |
Fachzeitschrift | IEEE International Symposium on Electromagnetic Compatibility |
Jahrgang | 1 |
Publikationsstatus | Veröffentlicht - 8 Okt. 2004 |
Extern publiziert | Ja |
Veranstaltung | 2004 IEEE International Symposium on Electromagnetic Compatibility: EMC 2004 - Santa Clara, USA / Vereinigte Staaten Dauer: 9 Aug. 2004 → 13 Aug. 2004 |
ASJC Scopus subject areas
- Physik der kondensierten Materie
- Elektrotechnik und Elektronik