@inproceedings{8bdd2da6077045d49d2a701e3bba5291,
title = "A low frequency electric field probe for near-field measurement in EMC applications",
abstract = "A low frequency electric field probe with high sensitivity was designed for locating radiated emissions source in electronic systems from 10 kHz to 100 MHz. This probe consists of a dipole at probe tip loaded with an op-amp built instrumentation amplifier, whose output then is amplified by a cascaded RF amplifier. The probe dipole is capacitively loaded by the instrumentation amplifier, resulting in a flat frequency response with high sensitivity at low frequency. The instrumentation amplifier also converts differential dipole output to single-ended signal without the need of an external hybrid. Additionally, the instrument amplifier suppresses common-mode noise picked up by the probe dipole. Measured data from probe above a microstrip trace shows flat frequency response of wanted field coupling and 30 dB - 40 dB suppression of unwanted field coupling from 10 kHz to 100 MHz.",
keywords = "electric field probe, high sensitivty, instrumentation amplifier, low frequency measurement, near-field measurement",
author = "Guanghua Li and David Pommerenke and Jin Min",
year = "2017",
month = oct,
day = "20",
doi = "10.1109/ISEMC.2017.8077921",
language = "English",
series = "IEEE International Symposium on Electromagnetic Compatibility",
publisher = "Institute of Electrical and Electronics Engineers",
pages = "498--503",
booktitle = "2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings",
address = "United States",
note = "2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 ; Conference date: 07-08-2017 Through 11-08-2017",
}