A low frequency electric field probe for near-field measurement in EMC applications

Guanghua Li, David Pommerenke, Jin Min

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

A low frequency electric field probe with high sensitivity was designed for locating radiated emissions source in electronic systems from 10 kHz to 100 MHz. This probe consists of a dipole at probe tip loaded with an op-amp built instrumentation amplifier, whose output then is amplified by a cascaded RF amplifier. The probe dipole is capacitively loaded by the instrumentation amplifier, resulting in a flat frequency response with high sensitivity at low frequency. The instrumentation amplifier also converts differential dipole output to single-ended signal without the need of an external hybrid. Additionally, the instrument amplifier suppresses common-mode noise picked up by the probe dipole. Measured data from probe above a microstrip trace shows flat frequency response of wanted field coupling and 30 dB - 40 dB suppression of unwanted field coupling from 10 kHz to 100 MHz.

Originalspracheenglisch
Titel2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten498-503
Seitenumfang6
ISBN (elektronisch)9781538622308
DOIs
PublikationsstatusVeröffentlicht - 20 Okt 2017
Extern publiziertJa
Veranstaltung2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, USA / Vereinigte Staaten
Dauer: 7 Aug 201711 Aug 2017

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

Konferenz2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
LandUSA / Vereinigte Staaten
OrtWashington
Zeitraum7/08/1711/08/17

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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