A FEM-BEM approach using level-sets in electrical capacitance tomography

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	591-605
Fachzeitschrift	COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering
Jahrgang	24
Ausgabenummer	2
Publikationsstatus	Veröffentlicht - 2005

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@article{762e48ab0a8b442792caa5a11fca33c5,

title = "A FEM-BEM approach using level-sets in electrical capacitance tomography",

author = "Bernhard Kortschak and Bernhard Brandst{\"a}tter",

year = "2005",

language = "English",

volume = "24",

pages = "591--605",

journal = "COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering",

issn = "2054-5606",

publisher = "Emerald Group Publishing Ltd.",

number = "2",

}

TY - JOUR

T1 - A FEM-BEM approach using level-sets in electrical capacitance tomography

AU - Kortschak, Bernhard

AU - Brandstätter, Bernhard

PY - 2005

Y1 - 2005

M3 - Article

SN - 2054-5606

VL - 24

SP - 591

EP - 605

JO - COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

JF - COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

IS - 2

ER -