A dual-current-probe method for characterizing common-mode loop impedance

Geping Liu*, Yimin Ding, Chingchi Chen, Richard Kautz, James L. Drewniak, David J. Pommerenke, Marina Y. Koledintseva

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: KonferenzbeitragPaper

Abstract

The definition of common-mode loop impedance is proposed instead of the ambiguous definition of common-mode impedance. Moreover, a non-invasive measurement method to characterize the common-mode loop impedance using dual clamp-on current probe is presented herein. The frequency responses of the current probes are de-embedded through a calibration procedure. Independent direct measurements using a network analyzer corroborate the validity of the Dual-Current-Probe Method.

Originalspracheenglisch
Seiten1239-1244
Seitenumfang6
PublikationsstatusVeröffentlicht - 14 Jul 2003
Extern publiziertJa
VeranstaltungProceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, USA / Vereinigte Staaten
Dauer: 20 Mai 200322 Mai 2003

Konferenz

KonferenzProceedings of the 20th IEEE Information and Measurement Technology Conference
LandUSA / Vereinigte Staaten
OrtVail, CO
Zeitraum20/05/0322/05/03

ASJC Scopus subject areas

  • !!Electrical and Electronic Engineering

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