Abstract
The definition of common-mode loop impedance is proposed instead of the ambiguous definition of common-mode impedance. Moreover, a non-invasive measurement method to characterize the common-mode loop impedance using dual clamp-on current probe is presented herein. The frequency responses of the current probes are de-embedded through a calibration procedure. Independent direct measurements using a network analyzer corroborate the validity of the Dual-Current-Probe Method.
Originalsprache | englisch |
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Seiten | 1239-1244 |
Seitenumfang | 6 |
Publikationsstatus | Veröffentlicht - 14 Juli 2003 |
Extern publiziert | Ja |
Veranstaltung | Proceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, USA / Vereinigte Staaten Dauer: 20 Mai 2003 → 22 Mai 2003 |
Konferenz
Konferenz | Proceedings of the 20th IEEE Information and Measurement Technology Conference |
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Land/Gebiet | USA / Vereinigte Staaten |
Ort | Vail, CO |
Zeitraum | 20/05/03 → 22/05/03 |
ASJC Scopus subject areas
- Elektrotechnik und Elektronik