A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer, W. Waldhauser

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	EDGE 2005 - Book of Abstracts
Herausgeber (Verlag)	.
Seiten	48-48
Publikationsstatus	Veröffentlicht - 2005
Veranstaltung	Enhanced Data Generated by Electrons - Grundlsee, Österreich Dauer: 1 Mai 2005 → 5 Mai 2005

Konferenz	Enhanced Data Generated by Electrons
Land/Gebiet	Österreich
Ort	Grundlsee
Zeitraum	1/05/05 → 5/05/05

Dieses zitieren

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title = "A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films",

author = "Michael Rogers and Gerald Kothleitner and Bernhard Schaffer and W. Waldhauser",

year = "2005",

language = "English",

pages = "48--48",

booktitle = "EDGE 2005 - Book of Abstracts",

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note = "Enhanced Data Generated by Electrons ; Conference date: 01-05-2005 Through 05-05-2005",

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TY - GEN

T1 - A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

AU - Rogers, Michael

AU - Kothleitner, Gerald

AU - Schaffer, Bernhard

AU - Waldhauser, W.

PY - 2005

Y1 - 2005

M3 - Conference paper

SP - 48

EP - 48

BT - EDGE 2005 - Book of Abstracts

PB - .

T2 - Enhanced Data Generated by Electrons

Y2 - 1 May 2005 through 5 May 2005

ER -