A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits

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Originalsprache	englisch
Titel	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Herausgeber (Verlag)	.
Seiten	151-156
Publikationsstatus	Veröffentlicht - 2005

Fields of Expertise

@inproceedings{26d1a6b12c72447baabecd6e1992a097,

title = "A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits",

author = "Bernd Deutschmann",

year = "2005",

language = "English",

pages = "151--156",

booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",

publisher = ".",

}