A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films

Heinz-Georg Flesch, Oliver Werzer, Martin Weis, Jan Jakabovic, Jaroslav Kovac, Daniel Hasko, Georg Jakopic, Harry J Wondergem, Roland Resel

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2008
VeranstaltungXTOP 2008 - Linz, Austria
Dauer: 15 Sep 200819 Sep 2008

Konferenz

KonferenzXTOP 2008
OrtLinz, Austria
Zeitraum15/09/0819/09/08

Treatment code (Nähere Zuordnung)

  • Experimental

Dies zitieren

Flesch, H-G., Werzer, O., Weis, M., Jakabovic, J., Kovac, J., Hasko, D., ... Resel, R. (2008). A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films. Postersitzung präsentiert bei XTOP 2008, Linz, Austria, .

A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films. / Flesch, Heinz-Georg; Werzer, Oliver; Weis, Martin; Jakabovic, Jan; Kovac, Jaroslav; Hasko, Daniel; Jakopic, Georg; Wondergem, Harry J; Resel, Roland.

2008. Postersitzung präsentiert bei XTOP 2008, Linz, Austria, .

Publikation: KonferenzbeitragPosterForschung

Flesch, H-G, Werzer, O, Weis, M, Jakabovic, J, Kovac, J, Hasko, D, Jakopic, G, Wondergem, HJ & Resel, R 2008, 'A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films', Linz, Austria, 15/09/08 - 19/09/08, .
Flesch H-G, Werzer O, Weis M, Jakabovic J, Kovac J, Hasko D et al. A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films. 2008. Postersitzung präsentiert bei XTOP 2008, Linz, Austria, .
Flesch, Heinz-Georg ; Werzer, Oliver ; Weis, Martin ; Jakabovic, Jan ; Kovac, Jaroslav ; Hasko, Daniel ; Jakopic, Georg ; Wondergem, Harry J ; Resel, Roland. / A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films. Postersitzung präsentiert bei XTOP 2008, Linz, Austria, .
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title = "A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films",
author = "Heinz-Georg Flesch and Oliver Werzer and Martin Weis and Jan Jakabovic and Jaroslav Kovac and Daniel Hasko and Georg Jakopic and Wondergem, {Harry J} and Roland Resel",
year = "2008",
language = "English",
note = "XTOP 2008 ; Conference date: 15-09-2008 Through 19-09-2008",

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TY - CONF

T1 - A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films

AU - Flesch, Heinz-Georg

AU - Werzer, Oliver

AU - Weis, Martin

AU - Jakabovic, Jan

AU - Kovac, Jaroslav

AU - Hasko, Daniel

AU - Jakopic, Georg

AU - Wondergem, Harry J

AU - Resel, Roland

PY - 2008

Y1 - 2008

M3 - Poster

ER -