3D-Nanoprinting of Magnetic Force Microscopy Tips

Michele Brugger-Hatzl; Robert Winkler; Lukas Matthias Seewald; Stefan Mitsche; Thomas Radlinger; Michael Huth; Sven Barth; Harald Plank

3D-Nanoprinting of Magnetic Force Microscopy Tips

Michele Brugger-Hatzl, Robert Winkler, Lukas Matthias Seewald, Stefan Mitsche, Thomas Radlinger, Michael Huth, Sven Barth, Harald Plank

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Konferenzbeitrag › Poster

Abstract

Magneticdevices play an important role in modernelectronics, sensing or data storage To analyze relatedmaterials in a comprehensive way, combined SEMAFM studies are often not optional but essential Fig 1shows such an example where SE, BSE, AFM and MFMinformation complement each other in an ideal wayMFM benefits in particular from vacuum conditions, asQ factors and by that magnetic sensitivities stronglyincrease (Fig 2 To exploit the full potential, highresolution MFM tips are needed for such instrumentation which are the topic of this study

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2022
Veranstaltung	8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing: FEBIP 2022 - Krakow, Krakow, Polen Dauer: 12 Juli 2022 → 15 Juli 2022 https://acmin.agh.edu.pl/en/febip2022/

Konferenz

Konferenz	8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing
Kurztitel	FEBIP 2022
Land/Gebiet	Polen
Ort	Krakow
Zeitraum	12/07/22 → 15/07/22
Internetadresse	https://acmin.agh.edu.pl/en/febip2022/

ASJC Scopus subject areas

Allgemeine Materialwissenschaften

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Zugriff auf Dokument

FEBIP_Poster_BruggerHatzl_finalLizenz: Nicht definiert

Dieses zitieren

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abstract = "Magneticdevices play an important role in modernelectronics, sensing or data storage To analyze relatedmaterials in a comprehensive way, combined SEMAFM studies are often not optional but essential Fig 1shows such an example where SE, BSE, AFM and MFMinformation complement each other in an ideal wayMFM benefits in particular from vacuum conditions, asQ factors and by that magnetic sensitivities stronglyincrease (Fig 2 To exploit the full potential, highresolution MFM tips are needed for such instrumentation which are the topic of this study",

author = "Michele Brugger-Hatzl and Robert Winkler and Seewald, {Lukas Matthias} and Stefan Mitsche and Thomas Radlinger and Michael Huth and Sven Barth and Harald Plank",

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T1 - 3D-Nanoprinting of Magnetic Force Microscopy Tips

AU - Brugger-Hatzl, Michele

AU - Winkler, Robert

AU - Seewald, Lukas Matthias

AU - Mitsche, Stefan

AU - Radlinger, Thomas

AU - Huth, Michael

AU - Barth, Sven

AU - Plank, Harald

PY - 2022

Y1 - 2022

N2 - Magneticdevices play an important role in modernelectronics, sensing or data storage To analyze relatedmaterials in a comprehensive way, combined SEMAFM studies are often not optional but essential Fig 1shows such an example where SE, BSE, AFM and MFMinformation complement each other in an ideal wayMFM benefits in particular from vacuum conditions, asQ factors and by that magnetic sensitivities stronglyincrease (Fig 2 To exploit the full potential, highresolution MFM tips are needed for such instrumentation which are the topic of this study

AB - Magneticdevices play an important role in modernelectronics, sensing or data storage To analyze relatedmaterials in a comprehensive way, combined SEMAFM studies are often not optional but essential Fig 1shows such an example where SE, BSE, AFM and MFMinformation complement each other in an ideal wayMFM benefits in particular from vacuum conditions, asQ factors and by that magnetic sensitivities stronglyincrease (Fig 2 To exploit the full potential, highresolution MFM tips are needed for such instrumentation which are the topic of this study

M3 - Poster

T2 - 8th FEBIP Workshop of the Focused-Electron-Beam-Induced-Processing

Y2 - 12 July 2022 through 15 July 2022

ER -