TY - GEN
T1 - 20V-high speed low cost arbitrary waveform generator for ICs immunity test
AU - Gao, Xu
AU - Li, Tianqi
AU - Mentesana, Nicholas Bennett
AU - Yu, Zhenwei
AU - Gafarov, Aleksandr Yakubovich
AU - Ren, Liehui
AU - An, Hongyu
AU - Pommerenke, David
PY - 2011/10/24
Y1 - 2011/10/24
N2 - A 30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz-6 GHz) power amplifier allowing 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
AB - A 30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz-6 GHz) power amplifier allowing 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
UR - http://www.scopus.com/inward/record.url?scp=80054766206&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2011.6038426
DO - 10.1109/ISEMC.2011.6038426
M3 - Conference paper
AN - SCOPUS:80054766206
SN - 9781424447831
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 846
EP - 849
BT - EMC 2011 - Proceedings
T2 - 2011 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 14 August 2011 through 19 August 2011
ER -