High temperature attachment for 4-circle x-ray diffractometers

  • Eiper, Ernst, (Teilnehmer (Co-Investigator))
  • Sonderegger, Bernhard (Teilnehmer (Co-Investigator))
  • Resel, Roland (Teilnehmer (Co-Investigator))
  • Koini, Markus, (Teilnehmer (Co-Investigator))
  • Tamas, Eduard-Tiberiu, (Teilnehmer (Co-Investigator))

Projekt: Arbeitsgebiet

Projektdetails

Beschreibung

In cooperation with the company Anton Paar GmbH, Graz new types of temperature attachments are developed. The attachments are suitable to any kind 4-circle diffractometer. The first attachment was commercially availabe in the year 2002, the second development was available from 2006.
StatusLaufend
Tatsächlicher Beginn/ -es Ende1/01/00 → …

Publikationen

Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100)

Keckes, J., Hafok, M., Eiper, E., Hofer, A., Resel, R. & Eisenmenger-Sittner, C., 2004, in : Powder diffraction. 19, 4, S. 367-371

Publikation: Beitrag in einer FachzeitschriftArtikel

Thermally induced stresses in thin aluminium layers grown on silicon

Eiper, E., Resel, R., Eisenmenger-Sittner, C., Hafok, M. & Keckes, J., 2004, in : Powder diffraction. 19, 1, S. 74-76

Publikation: Beitrag in einer FachzeitschriftArtikel