Material Science
Focused Ion Beam
77%
Thin Films
66%
Materials
61%
Temperature
50%
Metal
40%
Resonator
38%
Devices
38%
Semiconductor Device
33%
Aluminum Nitride
33%
Two-Dimensional Material
33%
Microstructure
33%
Air
33%
Iron
33%
Monolayers
33%
Epitaxy
33%
X-Ray Diffraction
27%
Charge Carrier
25%
Tungsten
22%
Impurity
22%
Conductivity
22%
Materials Property
22%
Microelectromechanical System
22%
Characterization
22%
Electrical Material
22%
Materials Characterization
22%
Scanning Electron Microscopy
22%
Piezoelectricity
16%
Phyllosilicate
16%
Elastic Moduli
16%
Nanoindentation
16%
Yttrium
16%
Transmission Electron Microscopy
16%
Piezoelectric Property
16%
Carrier Concentration
16%
Nitride Compound
16%
Film Growth
16%
Silicon
13%
Carbide
11%
Cobalt
11%
Crystal Structure
11%
Magnetic Material
8%
Magnetic Property
8%
SQUID (Device)
8%
Layered Material
8%
Iron Ion
8%
Microscopy
8%
Structural Analysis
8%
Semiconductor Material
6%
Powder
6%
Materials Science
6%
Engineering
Milling (Machining)
100%
Experiments
66%
Contamination
66%
High Quality
50%
Large Area
33%
Railroad Cars
33%
Temperature
33%
Demonstrates
33%
Nanofabrication Process
33%
Research Group
33%
Magnetron
33%
Protective Layer
33%
Nitride
33%
Micro-Electro-Mechanical System
33%
Fields
33%
Bulk Material
33%
In Situ TEM
33%
Coupling Coefficient
16%
Oxygen Content
16%
Defects
16%
Time-of-Flight
16%
Acoustics
16%
Filter
16%
Significant Reduction
16%
Research
16%
Surface Acoustic Wave
16%
Resonator
16%
Characteristics
16%
Transmissions
16%
Measurement
16%
Application
16%
Room Temperature
16%
Atomic Force Microscopy
16%
Ray Diffraction
16%
Crystallographic Texture
16%
Models
16%
Silicon Substrate
16%
Current Signal
11%
Diffusion Equation
11%
Physics
Epitaxy
33%
View
33%
Utilization
33%
Spectroscopy
33%
Microelectromechanical System
33%
Photonics
16%
Flexibility
16%
Quality
11%
X Ray Spectra
11%
Density of States
8%
Spintronics
8%
Transport Property
8%
Physics
8%
Dislocation
8%
Position (Location)
8%
Standard
8%
Metal
8%
Alloy
8%
Detection
5%
Side
5%
Independent Variables
5%
X Ray Spectroscopy
5%
X Ray
5%
Energy Levels
5%
